+15% Growth in 2025: Metrology and Inspection Drive Semiconductor Innovation - Indiatimes

According to a report by Indian business news website Indiatimes, the global semiconductor industry is projected to achieve 15% growth in 2025, primarily driven by continuous advancements in metrology... Read original →

The shift from 3nm to 2nm isn't just scaling—it's a stress test for metrology and inspection at atomic precision. This forces co-optimization across the tech stack: EUV tools, ALD chambers, and EDA must now integrate in-situ metrology, with foundries like TSMC and Samsung allocating over 30% of new fab budgets to real-time inspection systems. U.S. export controls on advanced process equipment are inflating compliance costs for Taiwan, China and mainland China players, especially in e-beam and AI-enhanced optical metrology, heightening supply chain fragmentation risks. Applied Materials, KLA, and ASML will intensify bundled-solution rivalry, while Japanese and Dutch firms fortify niche dominance. Within 18 months, yield ramp speed will hinge on metrology data feedback loops—fabs without closed-loop architectures risk exclusion from the high-end market.