SemiPulse | AI-Powered Semiconductor Supply Chain Intelligence & Market Signals

This article focuses on the market innovation of advanced packaging metrology systems, a critical component within the semiconductor supply chain. As chip integration continues to increase, traditional packaging technologies struggle to meet growing performance demands, necessitating the emergence o

Advanced Packaging Metrology System Market Innovation Semiconductor Industry Manufacturing Technology Supply Chain Technology Development Market Analysis

Rigaku Opens "Rigaku Solutions Center Osaka" to Strengthen Global Semiconductor Metrology Service Capabilities - Morningstar

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www.morningstar.com 2026-07-08

Rigaku Corporation has opened the Rigaku Solutions Center Osaka (RSC-Osaka) at its Osaka Plant to enhance global semiconductor metrology service capabilities. As semiconductor manufacturing processes advance toward finer geometries and more complex structures, precision and stability in metrology sy

Semiconductor Metrology X-ray Analysis Rigaku Osaka Plant Field Service Engineers Cleanroom Equipment Maintenance Technology Upgrade

Inspection And Metrology Catching Up For High-Density Fan-Out Panel Packaging

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semiengineering.com 2026-07-07

The surge in demand for AI and HPC devices is driving the semiconductor industry toward panel-level packaging (PLP) to accommodate increasingly large chip sizes. HDFO panel packaging requires higher RDL layer counts, increased micropillar height, and reduced trace and bump pitches, posing new challe

Semiconductor Packaging Panel-Level Packaging High-Density Fan-Out Inspection Technology Metrology Equipment AI Chips HPC Devices RDL Layers

+15% Growth in 2025: Metrology and Inspection Drive Semiconductor Innovation - Indiatimes

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datacenters.economictimes.indiatimes.com 2026-06-30

According to a report by Indian business news website Indiatimes, the global semiconductor industry is projected to achieve 15% growth in 2025, primarily driven by continuous advancements in metrology and inspection technologies. Metrology and inspection serve as critical components in semiconductor

Semiconductor Industry Metrology Innovation 2025 Forecast Semiconductor Manufacturing Technology Development Industry Growth Advanced Process

Nearfield Raises $380M to Advance AI-Era Semiconductor Metrology - Metrology and Quality News

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metrology.news 2026-06-24

Nearfield Instruments has successfully closed a $380 million Series-D funding round, valuing the company at $1.6 billion, marking a significant milestone in its development as a global leader in semiconductor metrology and inspection. Led by Fidelity Management & Research Company, the round also inc

Semiconductor Metrology AI Chips 3D Metrology EUV Lithography Chip Manufacturing Process Control Advanced Nodes Funding Round

Semiconductor Metrology Specialist Nearfield Instruments Secures $380M | Business | Jun 2026 - Photonics Spectra

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www.photonics.com 2026-06-23

Nearfield Instruments' $380 million financing underscores the semiconductor industry's growing demand for high-precision measurement technologies. As the semiconductor industry advances toward smaller process nodes, the need for accurate metrology solutions continues to rise, positioning Nearfield I

Semiconductor Metrology Photonics Detection Technology Semiconductor Equipment Technology Financing Nearfield Instruments 380 Million Dollars Semiconductor Industry

As Chips Go Vertical, Metrology Struggles to Keep Up

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eetimes.com 2026-06-09

As semiconductor devices evolve toward three-dimensional vertical architectures, traditional metrology techniques face significant challenges. Conventional methods like optical metrology and CD-SEM, designed for lateral scaling, are increasingly inadequate for inspecting deep and narrow structures s

semiconductor manufacturing metrology 3D structures vertical integration EUV lithography CD-SEM atomic force microscopy nanoscale structures

Using Graph Attention for Virtual Metrology in Semiconductor Manufacturing (Intel Foundry, ASU) - Semiconductor Engineering

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semiengineering.com 2026-06-03

Researchers from Arizona State University and Intel Foundry have developed a graph attention-based virtual metrology framework for film deposition processes in semiconductor manufacturing. As nanoscale production demands precise process control, traditional physical metrology faces limitations due t

Virtual Metrology Graph Attention Mechanism Semiconductor Manufacturing Film Deposition Artificial Intelligence Equipment Sensor Data Process Control Process Optimization

Curvilinear Masks Push The Limits Of Inspection And Metrology

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semiengineering.com 2026-05-27

As semiconductor processes advance toward smaller nodes, curvilinear masks are becoming increasingly mainstream, posing new challenges across the entire ecosystem—from design and mask data preparation to writing, inspection, and metrology. Experts emphasize that the entire mask data preparation flow

Curvilinear masks Photomask Inspection technology Metrology EUV lithography High-NA EUV Mask data preparation Multi-beam writing

Rigaku Speeds Next-Gen Semiconductor Metrology Development - World Business Outlook

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worldbusinessoutlook.com 2026-05-13

Rigaku Accelerates Next-generation Semiconductor Metrology Development Leveraging World-Class Research Infrastructure – News Hub - Medianet News Hub

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newshub.medianet.com.au 2026-05-12

Rigaku Accelerates Next-generation Semiconductor Metrology Development Leveraging World-Class Research Infrastructure - PA Media

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pressreleasehub.pa.media 2026-05-12

Rigaku Accelerates Next-generation Semiconductor Metrology Development Leveraging World-Class Research Infrastructure - Business Wire

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